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28 March 1995 Microwave-source time-resolved infrared radiometry for monitoring of curing and deposition processes
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Thermal wave methods employing optical heating sources have been used successfully in the past to determine layer thicknesses or thermal diffusivities. However, monitoring of curing or deposition processes can be difficult with such techniques due to changes in the sample surface properties such as optical absorption during processing. The method introduced in this paper, microwave-source time-resolved infrared radiometry (TRIR) in conjunction with intentionally embedded carbon or metal fibers allows the determination of surface layer thickness and thermal diffusivity almost independently of the surface properties of the layer. This suggests the use of fibers as embedded sensors in applications where layer thickness or thermal properties need to be controlled during processing.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert Osiander, Jane W. Maclachlan Spicer, and John C. Murphy "Microwave-source time-resolved infrared radiometry for monitoring of curing and deposition processes", Proc. SPIE 2473, Thermosense XVII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications, (28 March 1995);

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