PROCEEDINGS VOLUME 2474
SPIE'S 1995 SYMPOSIUM ON OE/AEROSPACE SENSING AND DUAL USE PHOTONICS | 17-21 APRIL 1995
Smart Focal Plane Arrays and Focal Plane Array Testing
SPIE'S 1995 SYMPOSIUM ON OE/AEROSPACE SENSING AND DUAL USE PHOTONICS
17-21 April 1995
Orlando, FL, United States
Smart Focal Plane Arrays I
Proc. SPIE 2474, Nonuniformity correction of infrared imaging arrays by analog techniques, 0000 (30 May 1995); https://doi.org/10.1117/12.210554
Proc. SPIE 2474, Digital characterization of a neuromorphic IRFPA, 0000 (30 May 1995); https://doi.org/10.1117/12.210564
Proc. SPIE 2474, Continuous-time calibration of VLSI sensors for gain and offset variations, 0000 (30 May 1995); https://doi.org/10.1117/12.210573
Proc. SPIE 2474, Adaptive filtering image preprocessing for smart FPA technology, 0000 (30 May 1995); https://doi.org/10.1117/12.210574
Proc. SPIE 2474, Recent developments in the wave process, 0000 (30 May 1995); https://doi.org/10.1117/12.210575
Proc. SPIE 2474, Continuing developments in biologically inspired smart focal plane concepts, 0000 (30 May 1995); https://doi.org/10.1117/12.210576
Proc. SPIE 2474, Focal plane analog-to-digital conversion development, 0000 (30 May 1995); https://doi.org/10.1117/12.210577
Proc. SPIE 2474, On-chip analog-to-digital conversion suitable for uncooled focal plane detector arrays employed in smart IR sensors, 0000 (30 May 1995); https://doi.org/10.1117/12.210578
Proc. SPIE 2474, CMOS analog-to-digital conversion for uncooled bolometer infrared detector arrays, 0000 (30 May 1995); https://doi.org/10.1117/12.210544
Proc. SPIE 2474, Uncooled pyroelectric arrays for contactless temperature measurements, 0000 (30 May 1995); https://doi.org/10.1117/12.210545
Proc. SPIE 2474, Estimating temperature and emissivity for infrared measurements using a PtSi Schottky-barrier infrared CCD image sensor, 0000 (30 May 1995); https://doi.org/10.1117/12.210546
Scene Generation and Integrated Test Facilities
Proc. SPIE 2474, Wideband infrared scene projector (WISP), 0000 (30 May 1995); https://doi.org/10.1117/12.210547
Proc. SPIE 2474, Direct-write scene generation test facility system noise study, 0000 (30 May 1995); https://doi.org/10.1117/12.210548
Proc. SPIE 2474, Signal processing hardware and software applied to the development of a real-time infrared mission simulation test capability, 0000 (30 May 1995); https://doi.org/10.1117/12.210549
Proc. SPIE 2474, Integrated approach to focal plane array testing at the Arnold Engineering Development Center, 0000 (30 May 1995); https://doi.org/10.1117/12.210550
Proc. SPIE 2474, Test and evaluation facility for THAAD IR seekers, 0000 (30 May 1995); https://doi.org/10.1117/12.210551
Proc. SPIE 2474, Space testing at the Arnold Engineering Development Center, 0000 (30 May 1995); https://doi.org/10.1117/12.210552
Proc. SPIE 2474, Focal plane characterization capabilities at NCCOSC RDT&E Div., 0000 (30 May 1995); https://doi.org/10.1117/12.210553
Radiometric Calibration and Two-Point Correction of FPA's
Proc. SPIE 2474, Stability evaluation of staring InSb imagers, 0000 (30 May 1995); https://doi.org/10.1117/12.210555
Proc. SPIE 2474, Characterization of post-correction uniformity on infrared focal plane arrays, 0000 (30 May 1995); https://doi.org/10.1117/12.210556
Proc. SPIE 2474, Systematic and accurate characterization of infrared detectors for strategic surveillance applications, 0000 (30 May 1995); https://doi.org/10.1117/12.210557
Proc. SPIE 2474, Radiometric calibration of infrared detectors and thermal imaging systems, 0000 (30 May 1995); https://doi.org/10.1117/12.210558
Production Testing I
Proc. SPIE 2474, Low-cost replicating timing generator for visible and infrared focal plane operation, 0000 (30 May 1995); https://doi.org/10.1117/12.210559
Proc. SPIE 2474, Modular approach to focal plane array testing, 0000 (30 May 1995); https://doi.org/10.1117/12.210560
Proc. SPIE 2474, Accurate, high-throughput, low-cost testing of infrared focal plane arrays for defense-related systems, 0000 (30 May 1995); https://doi.org/10.1117/12.210561
Production Testing II
Proc. SPIE 2474, Equipment and process improvements in a second-generation technology test facility, 0000 (30 May 1995); https://doi.org/10.1117/12.210562
Proc. SPIE 2474, Test methodologies for linear longwave infrared detector array production, 0000 (30 May 1995); https://doi.org/10.1117/12.210563
Proc. SPIE 2474, Development of a focal plane array data system for component-level characterization and real-time mission simulation testing, 0000 (30 May 1995); https://doi.org/10.1117/12.210565
Specialized Testing
Proc. SPIE 2474, Low-level gamma dosimetry using low-leakage diodes, 0000 (30 May 1995); https://doi.org/10.1117/12.210566
Proc. SPIE 2474, Laser-induced upset of HgCdTe IR detectors, 0000 (30 May 1995); https://doi.org/10.1117/12.210567
Proc. SPIE 2474, Specialized focal plane array tests in the focal plane characterization chamber (FPCC), 0000 (30 May 1995); https://doi.org/10.1117/12.210568
Proc. SPIE 2474, Measurement of the spectral response of long-wavelength infrared focal plane arrays, 0000 (30 May 1995); https://doi.org/10.1117/12.210569
Proc. SPIE 2474, LWIR filter and materials testing at the Naval Command, Control and Ocean Surveillance Center RDT&E Division (NRaD), 0000 (30 May 1995); https://doi.org/10.1117/12.210570
Smart Focal Plane Arrays II
Proc. SPIE 2474, Performance evaluation of two retina-like preprocessors for imaging detector arrays, 0000 (30 May 1995); https://doi.org/10.1117/12.210571
Proc. SPIE 2474, 3D architectures for highly capable focal plane arrays, 0000 (30 May 1995); https://doi.org/10.1117/12.210572
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