Low-level gamma dosimetry using low-leakage diodes

Larry D. Flesner; Robert K. Creber; Ronald Keith Bentley

doi:10.1117/12.210566

30 May 1995 Low-level gamma dosimetry using low-leakage diodes

Larry D. Flesner, Robert K. Creber, Ronald Keith Bentley

Proceedings Volume 2474, Smart Focal Plane Arrays and Focal Plane Array Testing; (1995) https://doi.org/10.1117/12.210566
Event: SPIE's 1995 Symposium on OE/Aerospace Sensing and Dual Use Photonics, 1995, Orlando, FL, United States

Abstract

Low-leakage silicon p-i-n diodes have been investigated for gamma rate dosimetry. Radiation- induced current response was measured versus gamma flux rate in the range of 10⁷ to 10⁹ gamma-photons/cm²(DOT)s. Energy deposition dose rates inferred from radiation-induced current agree well with expected results based on gamma energy-absorption coefficients. Degradation of diode leakage current due to total dose was also tested.

Citation Download Citation

Larry D. Flesner, Robert K. Creber, and Ronald Keith Bentley "Low-level gamma dosimetry using low-leakage diodes", Proc. SPIE 2474, Smart Focal Plane Arrays and Focal Plane Array Testing, (30 May 1995); https://doi.org/10.1117/12.210566

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