25 November 1980 Microanalysis of Solar Cells
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Abstract
Applications of complementary surface analysis techniques (AES, SIMS, XPS) to solar cell device problems are discussed. Several examples of device interface and grain boundary problems are presented. Silicon, gallium arsenide and indium phosphide based devices are reviewed. Results of compositional and chemical analysis are correlated directly with EBIC measurements performed in-situ on identical sample areas. Those are, in turn, correlated with resulting photovoltaic device performance. The importance of microanalysis to the solution of critical device problems in the photovoltaics technology is emphasized.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lawrence L. Kazmerski, Lawrence L. Kazmerski, } "Microanalysis of Solar Cells", Proc. SPIE 0248, Role of Electro-Optics in Photovoltaic Energy Conversion, (25 November 1980); doi: 10.1117/12.970597; https://doi.org/10.1117/12.970597
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