Millimeter Wave Fabry-Perot Interferometer For The Measurement Of The Conductivity Of Thin Films For Solar Cells

Donald S. Gage; Leonard Lewin; Frank S. Barnes

doi:10.1117/12.970600

25 November 1980 Millimeter Wave Fabry-Perot Interferometer For The Measurement Of The Conductivity Of Thin Films For Solar Cells

Donald S. Gage, Leonard Lewin, Frank S. Barnes

Author Affiliations +

Proceedings Volume 0248, Role of Electro-Optics in Photovoltaic Energy Conversion; (1980) https://doi.org/10.1117/12.970600
Event: 24th Annual Technical Symposium, 1980, San Diego, United States

Abstract

The conductivity of a thin film on a metal plate can be calculated from measurements of the Q of the cavity of a Fabry-Perot interferometer and the thin film if the cavity without the film has been previously measured. The theory for the conductivity which shows a cubic dependence on the thickness of the film has been developed. The measurement system at 93 gigahertz is described. Experimental results are presented.

Citation Download Citation

Donald S. Gage, Leonard Lewin, and Frank S. Barnes "Millimeter Wave Fabry-Perot Interferometer For The Measurement Of The Conductivity Of Thin Films For Solar Cells", Proc. SPIE 0248, Role of Electro-Optics in Photovoltaic Energy Conversion, (25 November 1980); https://doi.org/10.1117/12.970600

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available