Paper
1 March 1995 Optical probing of the temperature and pressure transients at a liquid/solid interface due to pulsed laser-induced vaporization
Hee K. Park, Constantine P. Grigoropoulos, Chie C. Poon, Andrew C. Tam, Oguz Yavas, Paul Leiderer
Author Affiliations +
Proceedings Volume 2498, Laser Methods of Surface Treatment and Modification: ALT '94 International Conference; (1995) https://doi.org/10.1117/12.203634
Event: Laser Methods of Surface Treatment and Modification: ALT '94 International Conference, 1994, Konstanz, Germany
Abstract
The transient temperature and pressure field development in the excimer laser-induced vaporization of liquids in contact with a solid surface is studied. A thin silicon film, which has temperature-dependent optical properties, is embedded between an absorbing chromium film and a transparent fused quartz substrate. Static reflectivity measurement is performed to determine the thin film optical properties at elevated temperatures. The transient backward reflectance responses from the silicon layer are compared with heat transfer modeling results. The backward reflectance probe is not affected by the creation of bubbles and is successfully employed for the first time to measure non-intrusively the temperature development during the rapid vaporization process. The optical reflectance probes are applied from the front-side and back-side of the sample simultaneously to monitor the dynamic bubble nucleation behavior and transient temperature development, respectively, at various ambient pressures using a high- pressure cell. The investigation on the effect of ambient pressure on the bubble nucleation threshold combined with the surface temperature measurement determines the thermodynamic state of the superheated metastable liquid at the interface and subsequently the explosion pressure.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hee K. Park, Constantine P. Grigoropoulos, Chie C. Poon, Andrew C. Tam, Oguz Yavas, and Paul Leiderer "Optical probing of the temperature and pressure transients at a liquid/solid interface due to pulsed laser-induced vaporization", Proc. SPIE 2498, Laser Methods of Surface Treatment and Modification: ALT '94 International Conference, (1 March 1995); https://doi.org/10.1117/12.203634
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KEYWORDS
Reflectivity

Temperature metrology

Liquids

Excimer lasers

Solids

Chromium

Interfaces

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