Laser Speckle Metrology

J. M. Burch

doi:10.1117/12.953505

14 October 1971 Laser Speckle Metrology

J. M. Burch

Proceedings Volume 0025, Developments in Holography II; (1971) https://doi.org/10.1117/12.953505
Event: Developments in Holography, 1971, Boston, United States

Abstract

During the past three years several methods have been found for extracting useful information from laser speckle patterns, either visually or by photographic or photoelectric correlation techniques. Speckle interferometers can be used to detect movement or vibration, or to measure inplane strain of a loaded specimen. It is possible that they can be used for desensitised comparison of a succession of diffusely reflecting components against a master shape. As an example of a noninterferometric speckle device, a visual surface depth probe will be considered.

Citation Download Citation

J. M. Burch "Laser Speckle Metrology", Proc. SPIE 0025, Developments in Holography II, (14 October 1971); https://doi.org/10.1117/12.953505

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