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31 December 1980 Heterodyne Interferometer For Alignment Of The Two Elements Of A Reflaxicon
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Abstract
The design of a heterodyne interferometer to align the two elements of a reflaxicon is described. The discussion covers the optical, electro-optical, and mechanical design. In this application the interferometer is required to measure the phase variations across the wavefront of a probe beam that returns from the test optics. The measurement must have high resolution and be completed within about one second. The test wavefront must be corrected to remove system figure errors, alignment optics errors, and dynamic disturbance effects. The corrected wavefront is then processed to separate effects due to each degree of freedom of misalignment of the reflaxicon. Then each degree of freedom can be corrected by commands to mirror mount actuators from an alignment computer.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert A. Field "Heterodyne Interferometer For Alignment Of The Two Elements Of A Reflaxicon", Proc. SPIE 0251, Optical Alignment I, (31 December 1980); https://doi.org/10.1117/12.959452
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