V. N. Gudilin, G. I. Brukhnevich, V. B. Burmistrov, B. Z. Gorbenko, C. V. Gudilin, M. M. Egorov, Vladimir S. Ivanov, D. V. Jakovlev, Victor D. Shargorodsky
Proceedings Volume 21st International Congress on: High-Speed Photography and Photonics, (1995) https://doi.org/10.1117/12.209657
1. The streak camera for observation and measuring of characteristics of picosecond and nanosecond radiation processes with single photoelectron count mode was created.
2. The streak camera, in couple with calibrating systems of its characteristics and high-level software, may be applied both as experimental and standartifying units for ultra short optical signals.