PROCEEDINGS VOLUME 2516
SPIE'S 1995 INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION | 9-14 JULY 1995
X-Ray Microbeam Technology and Applications
Editor(s): Wenbing Yun
IN THIS VOLUME

4 Sessions, 24 Papers, 0 Presentations
Applications  (6)
SPIE'S 1995 INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION
9-14 July 1995
San Diego, CA, United States
X-Ray Microbeam Focusing Optics
Proc. SPIE 2516, Fabrication of high-resolution x-ray diffractive optics at King's College London, 0000 (25 September 1995); doi: 10.1117/12.221663
Proc. SPIE 2516, Microfocusing optics for hard xrays fabricated by x-ray lithography, 0000 (25 September 1995); doi: 10.1117/12.221670
Proc. SPIE 2516, Bragg-Fresnel optics at the ESRF: microdiffraction and microimaging applications, 0000 (25 September 1995); doi: 10.1117/12.221678
Proc. SPIE 2516, New generation of multilayer Bragg-Fresnel lenses, 0000 (25 September 1995); doi: 10.1117/12.221681
Proc. SPIE 2516, Microfocusing 4-keV to 65-keV xrays with bent Kirkpatrick-Baez mirrors, 0000 (25 September 1995); doi: 10.1117/12.221682
Proc. SPIE 2516, Parameter optimization for producing an elliptical surface from a spherical surface by differential deposition, 0000 (25 September 1995); doi: 10.1117/12.221683
Proc. SPIE 2516, Development of a novel x-ray focusing technique using crystals with a two-dimensionally modulated surfaces, 0000 (25 September 1995); doi: 10.1117/12.221684
Techniques and Imaging Systems
Proc. SPIE 2516, Scanning transmission x-ray microscope at the NSLS: from XANES to cryo, 0000 (25 September 1995); doi: 10.1117/12.221685
Proc. SPIE 2516, X-ray microscopy with high-resolution zone plates: recent developments, 0000 (25 September 1995); doi: 10.1117/12.221686
Proc. SPIE 2516, Ultrahigh-resolution soft x-ray tomography, 0000 (25 September 1995); doi: 10.1117/12.221664
Proc. SPIE 2516, Soft x-ray imaging and vector diffraction theory, 0000 (25 September 1995); doi: 10.1117/12.221665
Proc. SPIE 2516, Simulations and experiments on capillary optics for x-ray microbeams, 0000 (25 September 1995); doi: 10.1117/12.221666
Proc. SPIE 2516, Toward a micrometer resolution x-ray tomographic microscope, 0000 (25 September 1995); doi: 10.1117/12.221667
Applications
Proc. SPIE 2516, Chemical state mapping on material surfaces with the X1A second-generation scanning photoemission microscope (X1A SPEM-II), 0000 (25 September 1995); doi: 10.1117/12.221668
Proc. SPIE 2516, Direct observation of microscopic inhomogeneities in high-Tc superconductors using energy-dispersive diffraction of synchrotron-produced xrays, 0000 (25 September 1995); doi: 10.1117/12.221669
Proc. SPIE 2516, Microdiffraction measurements of the effects of grain alignment on critical current in high-temperature superconductors, 0000 (25 September 1995); doi: 10.1117/12.221671
Proc. SPIE 2516, Hard x-ray microanalytical beam line at the CAMD synchrotron, 0000 (25 September 1995); doi: 10.1117/12.221672
Proc. SPIE 2516, Soft x-ray microscopy and microanalysis: applications in organic geochemistry, 0000 (25 September 1995); doi: 10.1117/12.221673
Poster Session
Proc. SPIE 2516, X-ray supermirrors for BESSY-II, 0000 (25 September 1995); doi: 10.1117/12.221674
Proc. SPIE 2516, BESSY Bragg-Fresnel multilayer beam monitors, 0000 (25 September 1995); doi: 10.1117/12.221675
Proc. SPIE 2516, Tomographic scanning microscope for 1 to 4-KeV xrays, 0000 (25 September 1995); doi: 10.1117/12.221676
Proc. SPIE 2516, Elliptical wiggler beam line with minimum focal spot size at the ALS, 0000 (25 September 1995); doi: 10.1117/12.221677
Proc. SPIE 2516, White-light spacial frequency multiplication using soft xrays, 0000 (25 September 1995); doi: 10.1117/12.221679
Applications
Proc. SPIE 2516, Capillary xray compressor: principle versus practice, 0000 (25 September 1995); doi: 10.1117/12.221680
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