Calibration of the EIT instrument for the SOHO mission

Jean-Marc Defise; Xueyan Song; Jean-Pierre Delaboudiniere; Guy Edouard Artzner; Charles Carabetian; Jean-Francois E. Hochedez; Jacqueline Brunaud; J. Daniel Moses; Richard C. Catura; Frederic Clette; Andre Jean Maucherat

doi:10.1117/12.224924

16 October 1995 Calibration of the EIT instrument for the SOHO mission

Jean-Marc Defise, Xueyan Song, Jean-Pierre Delaboudiniere, Guy Edouard Artzner, Charles Carabetian, Jean-Francois E. Hochedez, Jacqueline Brunaud, J. Daniel Moses, Richard C. Catura, Frederic Clette, Andre Jean Maucherat

Author Affiliations +

Proceedings Volume 2517, X-Ray and EUV/FUV Spectroscopy and Polarimetry; (1995) https://doi.org/10.1117/12.224924
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

Optical characteristics in the wavelength range 15 - 75 nm of the EUV imaging telescope to be launched soon on the SOHO mission are discussed. Bandpasses and photometric sensitivity of the multilayered optics telescope have been measured by a dedicated synchrotron light source at Orsay, France.

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Jean-Marc Defise, Xueyan Song, Jean-Pierre Delaboudiniere, Guy Edouard Artzner, Charles Carabetian, Jean-Francois E. Hochedez, Jacqueline Brunaud, J. Daniel Moses, Richard C. Catura, Frederic Clette, and Andre Jean Maucherat "Calibration of the EIT instrument for the SOHO mission", Proc. SPIE 2517, X-Ray and EUV/FUV Spectroscopy and Polarimetry, (16 October 1995); https://doi.org/10.1117/12.224924

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