16 October 1995 Calibration of the EIT instrument for the SOHO mission
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Abstract
Optical characteristics in the wavelength range 15 - 75 nm of the EUV imaging telescope to be launched soon on the SOHO mission are discussed. Bandpasses and photometric sensitivity of the multilayered optics telescope have been measured by a dedicated synchrotron light source at Orsay, France.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jean-Marc Defise, Xueyan Song, Jean-Pierre Delaboudiniere, Guy Edouard Artzner, Charles Carabetian, Jean-Francois E. Hochedez, Jacqueline Brunaud, J. Daniel Moses, Richard C. Catura, Frederic Clette, Andre Jean Maucherat, "Calibration of the EIT instrument for the SOHO mission", Proc. SPIE 2517, X-Ray and EUV/FUV Spectroscopy and Polarimetry, (16 October 1995); doi: 10.1117/12.224924; https://doi.org/10.1117/12.224924
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KEYWORDS
Calibration

Telescopes

EUV optics

Extreme ultraviolet

Light sources

Multilayers

Synchrotrons

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