Soft x-ray (50-1800 eV) measurements of niobium superconducting tunnel junctions

David H. Lumb; Axel van Dordrecht; Anthony J. Peacock; Nicola Rando; Peter Verhoeve; J. Verveer; D. J. Goldie; John M. Lumley

doi:10.1117/12.218382

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1 September 1995 Soft x-ray (50-1800 eV) measurements of niobium superconducting tunnel junctions

David H. Lumb, Axel van Dordrecht, Anthony J. Peacock, Nicola Rando, Peter Verhoeve, J. Verveer, D. J. Goldie, John M. Lumley

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Proceedings Volume 2518, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VI; (1995) https://doi.org/10.1117/12.218382
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

Measurements are presented on the x ray response of superconducting tunnel junction (STJ) detectors, over the energy range of 50 - 1800 eV. This includes the measurement of the lowest x-ray energies published to date. Energy resolution and response linearity is measured as a function of device geometry. It is shown that self-recombination of quasi-particles leads to an energy non-linearity which depends on junction volume. The effect of count rate limitations on energy resolution is established for rates up to 10 kHz.

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David H. Lumb, Axel van Dordrecht, Anthony J. Peacock, Nicola Rando, Peter Verhoeve, J. Verveer, D. J. Goldie, and John M. Lumley "Soft x-ray (50-1800 eV) measurements of niobium superconducting tunnel junctions", Proc. SPIE 2518, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VI, (1 September 1995); https://doi.org/10.1117/12.218382

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