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1 September 1995 Soft x-ray (50-1800 eV) measurements of niobium superconducting tunnel junctions
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Abstract
Measurements are presented on the x ray response of superconducting tunnel junction (STJ) detectors, over the energy range of 50 - 1800 eV. This includes the measurement of the lowest x-ray energies published to date. Energy resolution and response linearity is measured as a function of device geometry. It is shown that self-recombination of quasi-particles leads to an energy non-linearity which depends on junction volume. The effect of count rate limitations on energy resolution is established for rates up to 10 kHz.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David H. Lumb, Axel van Dordrecht, Anthony J. Peacock, Nicola Rando, Peter Verhoeve, J. Verveer, D. J. Goldie, and John M. Lumley "Soft x-ray (50-1800 eV) measurements of niobium superconducting tunnel junctions", Proc. SPIE 2518, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VI, (1 September 1995); https://doi.org/10.1117/12.218382
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