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1 September 1995Soft x-ray (50-1800 eV) measurements of niobium superconducting tunnel junctions
Measurements are presented on the x ray response of superconducting tunnel junction (STJ) detectors, over the energy range of 50 - 1800 eV. This includes the measurement of the lowest x-ray energies published to date. Energy resolution and response linearity is measured as a function of device geometry. It is shown that self-recombination of quasi-particles leads to an energy non-linearity which depends on junction volume. The effect of count rate limitations on energy resolution is established for rates up to 10 kHz.
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David H. Lumb, Axel van Dordrecht, Anthony J. Peacock, Nicola Rando, Peter Verhoeve, J. Verveer, D. J. Goldie, John M. Lumley, "Soft x-ray (50-1800 eV) measurements of niobium superconducting tunnel junctions," Proc. SPIE 2518, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VI, (1 September 1995); https://doi.org/10.1117/12.218382