15 June 1995 Application of hybrid detector technology for digital mammography
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Abstract
A digital x-ray detector applying hybrid detector technology based on indium metal bump- bonding techniques was evaluated at x-ray energies of about 19.5 keV. Silicon of about 1 mm thickness forms the actual detector, converting x-rays directly into electrons (rather than generating light and converting light to photo-electrons). Time-delay-integration increases the sensitivity. Linearity, modulation transfer function, and noise power spectrum were evaluated. The results demonstrate that the system is useful as scanning x-ray detector for digital mammography and can meet and even exceed the performance of the conventional film/screen system.
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Hans Roehrig, Tong Yu, Stephen D. Gaalema, S. R. Dev Sharma, John A. Minteer, William E. Yorke, "Application of hybrid detector technology for digital mammography", Proc. SPIE 2519, X-Ray and Ultraviolet Sensors and Applications, (15 June 1995); doi: 10.1117/12.211899; https://doi.org/10.1117/12.211899
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