High-resolution CCD x-ray detector for microdiffraction and tomography applications

Reinhard Pahl

doi:10.1117/12.211896

15 June 1995 High-resolution CCD x-ray detector for microdiffraction and tomography applications

Reinhard Pahl

Proceedings Volume 2519, X-Ray and Ultraviolet Sensors and Applications; (1995) https://doi.org/10.1117/12.211896
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

This paper reports on the charge-coupled device (CCD) x-ray detector development for imaging and diffraction applications at CHESS, the Cornell High Energy Sychrotron Source. The detector currently under test is based on the Kodak KAF-0400 chip, featuring 512 X 768 pixels at 9 micrometers square pixel size. The final version of the device will use the KAF- 1600, which has four times the active area at the same pixel size. Different x-ray detection schemes are planes to adapt the detector most efficiently to the application. For imaging at high spatial resolution the x-rays are converted to visible light by phosphors, i.e. Gd₂O₃S:Tb screens or CdWO₄ single-crystals. An optical lens system focuses the phosphor image onto the CCD. Typical magnification factors for the optics are 3 to 1 to 1 to 1. This detector has been designed for radiography in materials science and biology. First tests on the performance of the device showed a good spatial resolution at a dynamic range of approximately 10 bits. To comply with the needs in diffraction experiments, e.g. microbeam and surface diffraction experiments, a second type of detector will be built. The front end of this device will consist of a scintillator coupled to a fiberoptic taper. The output of the demagnifying taper is focused onto the CCD. This concept allows a very compact design, necessary for a detector to be used routinely by users of the CHESS facility.

Citation Download Citation

Reinhard Pahl "High-resolution CCD x-ray detector for microdiffraction and tomography applications", Proc. SPIE 2519, X-Ray and Ultraviolet Sensors and Applications, (15 June 1995); https://doi.org/10.1117/12.211896

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