25 September 1995 Development of XUV interferometry (155 Å) using a soft x-ray laser
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Abstract
Over the past several years we have developed a variety of techniques for probing plasmas with x-ray lasers. These have included direct high resolution plasma imaging to quantify laser produced plasma uniformities and moire deflectometry to measure electron density profiles in one-dimension. Although these techniques have been valuable a need existed for direct two dimensional measurements of electron densities in large high density plasmas. For this reason we have worked on developing an xuv interferometer compatible with the harsh environment of laser produced plasmas. This paper describes our design and presents some results showing excellent fringe visibility using the neon-like yttrium x-ray laser operating at 155 angstrom. The coherence properties of this x-ray laser source were measured using interferometry and are also discussed.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Luiz Barroca Da Silva, Luiz Barroca Da Silva, Troy W. Barbee, Troy W. Barbee, Robert C. Cauble, Robert C. Cauble, Peter M. Celliers, Peter M. Celliers, Dino R. Ciarlo, Dino R. Ciarlo, Stephen B. Libby, Stephen B. Libby, Richard A. London, Richard A. London, Dennis L. Matthews, Dennis L. Matthews, Stanley Mrowka, Stanley Mrowka, Juan C. Moreno, Juan C. Moreno, James E. Trebes, James E. Trebes, Alan S. Wan, Alan S. Wan, Franz A. Weber, Franz A. Weber, "Development of XUV interferometry (155 Å) using a soft x-ray laser", Proc. SPIE 2520, Soft X-Ray Lasers and Applications, (25 September 1995); doi: 10.1117/12.221644; https://doi.org/10.1117/12.221644
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