18 September 1995 Vertical dispersion methods in x-ray spectroscopy of high-temperature plasmas
Author Affiliations +
Abstract
General formulae for the applying the vertical dispersion principle in x-ray spectroscopy of multiply charged ions are summarized, the characteristics of the experimental schemes based on flat and bent crystals are discussed. The unique properties of the novel spectroscopic methods, i.e. their extremely high dispersion, high spectral and 1D spatial resolution, and good collection efficiency, make them very attractive for ultrahigh-resolution spectroscopy. The examples of successful use of the vertical dispersion modifications of the double-crystal and the Johann sepctrometer in diagnostics of several types of laser-generated plasma are presented.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Oldrich Renner, Oldrich Renner, Thomas Missalla, Thomas Missalla, Eckhart Foerster, Eckhart Foerster, } "Vertical dispersion methods in x-ray spectroscopy of high-temperature plasmas", Proc. SPIE 2523, Applications of Laser Plasma Radiation II, (18 September 1995); doi: 10.1117/12.220976; https://doi.org/10.1117/12.220976
PROCEEDINGS
10 PAGES


SHARE
RELATED CONTENT

Preliminary results from the diffuse x-ray spectrometer
Proceedings of SPIE (November 18 1993)
Soft X-Ray Calibration of Diffracting Materials
Proceedings of SPIE (August 11 1986)
Space And Time Resolved Soft X Ray Spectra Using X...
Proceedings of SPIE (March 23 1982)
X-Ray Instrumentation in the LLL Laser-Fusion Program
Proceedings of SPIE (December 29 1976)

Back to Top