Measurement of the hemispherical reflectance and transmittance at variable angles of incidence

Andreas Gombert; Josef Steinhart; C. Sanowski; Konstantin Forcht; Franz Brucker; Wolfgang Graf; Michael Koehl

doi:10.1117/12.217338

23 August 1995 Measurement of the hemispherical reflectance and transmittance at variable angles of incidence

Andreas Gombert, Josef Steinhart, C. Sanowski, Konstantin Forcht, Franz Brucker, Wolfgang Graf, Michael Koehl

Proceedings Volume 2531, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XIV; (1995) https://doi.org/10.1117/12.217338
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

An apparatus was built to measure the spectral hemispherical reflectance and transmittance at variable angles of incidence. The apparatus consists of a Fourier-transform spectrometer, polarizers, and two integrating spheres. With one of the spheres, transmittance measurements can be performed, with the other, reflectance or absorptance measurements depending on the transmittance of the samples. The measurement range for transmittance measurements is from 400 nm to 2500 nm and for reflectance or absorptance measurements from 400 nm to 1900 nm. The design of the spheres and the optical set-up is described. The measurement accuracy was determined by measuring well-defined samples. Examples of measurements of different solar selective absorber coatings and anti-reflection layers are shown.

Citation Download Citation

Andreas Gombert, Josef Steinhart, C. Sanowski, Konstantin Forcht, Franz Brucker, Wolfgang Graf, and Michael Koehl "Measurement of the hemispherical reflectance and transmittance at variable angles of incidence", Proc. SPIE 2531, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XIV, (23 August 1995); https://doi.org/10.1117/12.217338

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