23 August 1995 Simple method to characterize the optical properties of textured TCO layers for amorphous silicon solar cell applications
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Abstract
It is well known that the light absorption in an amorphous silicon solar cell can be enhanced by applying textured transparent conductive oxide (TCO) substrates. However, the degree of the enhancement depends on the optical and surface properties of the TCO substrates: the refractive index n((lambda) ), the extinction coefficient k((lambda) ), the thickness d of the layer and the root mean square (rms) roughness (sigma) r of the rough surface. Because light scattering takes place at the rough surface, the transmittance spectroscopy cannot be directly applied to determine the TCO layer properties. We have studied the light scattering at the rough TCO surfaces. Based on our analysis, the reflected and transmitted light at a rough interface consists of a specular part and a diffused part. The specular reflectance and transmittance depend on the optical and surface properties of the TCO layer. We have developed a procedure to extract the optical and surface properties from the measured specular reflectance and transmittance. This extracting procedure and the results are presented in this paper.
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Guoqiao Tao, J. W. Metselaar, "Simple method to characterize the optical properties of textured TCO layers for amorphous silicon solar cell applications", Proc. SPIE 2531, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XIV, (23 August 1995); doi: 10.1117/12.217349; https://doi.org/10.1117/12.217349
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