6 September 1995 Imaging artifacts of dielectric specimens in transmission mode near-field scanning optical microscopy
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Abstract
Uncertainty in tip morphology of aluminum coated, fiber-optic near-field probes, and the large difference between the physical probe diameter and (smaller) optical diameter, lead to serious imaging artifacts in transmission mode near-field microscopy. Various dielectric materials of different topographies have been studied to develop an understanding of normal and anomalous contrast modes mainly characterized by topographically induced contrast.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gary A. Valaskovic, Mark A. Holton, George H. Morrison, "Imaging artifacts of dielectric specimens in transmission mode near-field scanning optical microscopy", Proc. SPIE 2535, Near-Field Optics, (6 September 1995); doi: 10.1117/12.218695; https://doi.org/10.1117/12.218695
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