Tunnel near-field optical microscopy (TNOM-2)

Bert Hecht; Dieter W. Pohl; Harry Heinzelmann; Lukas Novotny

doi:10.1117/12.218689

6 September 1995 Tunnel near-field optical microscopy (TNOM-2)

Bert Hecht, Dieter W. Pohl, Harry Heinzelmann, Lukas Novotny

Proceedings Volume 2535, Near-Field Optics; (1995) https://doi.org/10.1117/12.218689
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

Light emitted from the aperture of a near-field optical probe in the close vicinity of a dielectric object propagates in classically `forbidden' as well as `allowed' directions; the two zones are separated by the critical angle for total internal reflection. The new `tunnel' near-field optical microscopy (TNOM) technique makes use of forbidden and allowed radiation, in contrast to standard scanning near-field optical microscopy (SNOM or NSOM), which records only the allowed light. Scan images obtained with allowed and forbidden light are complementary to some extent; the latter, however, provide high contrast and resolution even in situations in which standard SNOM/NSOM shows little or no contrast. The influence of topography on image formation is analyzed and discussed.

Citation Download Citation

Bert Hecht, Dieter W. Pohl, Harry Heinzelmann, and Lukas Novotny "Tunnel near-field optical microscopy (TNOM-2)", Proc. SPIE 2535, Near-Field Optics, (6 September 1995); https://doi.org/10.1117/12.218689

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