Testing aspheric surfaces by TWHI

Yueqiang Lee; Yongchao Shi; Ling Du

doi:10.1117/12.218418

8 September 1995 Testing aspheric surfaces by TWHI

Yueqiang Lee, Yongchao Shi, Ling Du

Author Affiliations +

Proceedings Volume 2536, Optical Manufacturing and Testing; (1995) https://doi.org/10.1117/12.218418
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

The usage of two-wavelength holographic interferometry (TWHI) in testing aspherics and evaluating the testing results are discussed in the paper. TWHI accomplishes actual long- wavelength interferometry, using visible light as working wavelength. The sensitivity, accuracy, and range of measurement can be adjusted conveniently.

Citation Download Citation

Yueqiang Lee, Yongchao Shi, and Ling Du "Testing aspheric surfaces by TWHI", Proc. SPIE 2536, Optical Manufacturing and Testing, (8 September 1995); https://doi.org/10.1117/12.218418

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