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Multiple particle technique for determination of differential scattering cross section of very small surface bound particles
Optical scatter as a diagnostic tool for studying bulk defects which cause laser damage in conventional and rapid-growth KDP and DKDP
Instrumentation for the determination of material properties from spectroscopic measurements of total integrated scatter
Two portable devices for the measurement of scatter of a laser beam and evaluation of the scattering materials' Vos function
Optoelectronic scanning device for the observation of scattering of YAG laser light in semiconductor materials