Paper
1 September 1995 Instrumentation for the determination of material properties from spectroscopic measurements of total integrated scatter
G. Lewis Powell, T. E. Barber, John Ternay Neu
Author Affiliations +
Abstract
A variety of important optical properties can be determined from spectroscopic analysis of diffuse reflectance of surfaces. The design of a small user friendly, lightweight, field hardened, computer controlled device for performing infrared spectroscopic analysis of trace contaminants on surfaces is described. The device employs a miniature Fourier transform infrared spectrometer with very efficient diffuse reflectance optics and a portable computer to provide reflectance spectra of surfaces measured relative to some idealized surface. These spectra yield qualitative and quantitative chemical information from a host of surfaces that has imminently practical applications in the determination of surface identification, contamination, and degradation.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G. Lewis Powell, T. E. Barber, and John Ternay Neu "Instrumentation for the determination of material properties from spectroscopic measurements of total integrated scatter", Proc. SPIE 2541, Optical Scattering in the Optics, Semiconductor, and Computer Disk Industries, (1 September 1995); https://doi.org/10.1117/12.218330
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CITATIONS
Cited by 4 scholarly publications.
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KEYWORDS
Gold

Spectroscopy

Reflectivity

Inspection

Diffuse reflectance spectroscopy

FT-IR spectroscopy

Infrared spectroscopy

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