23 October 1995 Micro-Raman characterization of SiC polytype natural heterostructures
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MicroRaman, Raman, photoluminescence and x-ray diffraction spectra were measured for different SiC splices. It has been shown that Raman and especially MicroRaman scattering gives us a gain over other diagnostic techniques on the way to define polytype structure of the splice.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Victor V. Artamonov, Victor V. Artamonov, Alexei V. Pogorelov, Alexei V. Pogorelov, Marion Renucci, Marion Renucci, Mikhail Ya. Valakh, Mikhail Ya. Valakh, } "Micro-Raman characterization of SiC polytype natural heterostructures", Proc. SPIE 2543, Silicon Carbide Materials for Optics and Precision Structures, (23 October 1995); doi: 10.1117/12.225295; https://doi.org/10.1117/12.225295

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