23 October 1995 Micro-Raman characterization of SiC polytype natural heterostructures
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Abstract
MicroRaman, Raman, photoluminescence and x-ray diffraction spectra were measured for different SiC splices. It has been shown that Raman and especially MicroRaman scattering gives us a gain over other diagnostic techniques on the way to define polytype structure of the splice.
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Victor V. Artamonov, Victor V. Artamonov, Alexei V. Pogorelov, Alexei V. Pogorelov, Marion Renucci, Marion Renucci, Mikhail Ya. Valakh, Mikhail Ya. Valakh, } "Micro-Raman characterization of SiC polytype natural heterostructures", Proc. SPIE 2543, Silicon Carbide Materials for Optics and Precision Structures, (23 October 1995); doi: 10.1117/12.225295; https://doi.org/10.1117/12.225295
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