New approach to the optimization of HNDT applications

Petra Aswendt

doi:10.1117/12.211877

14 June 1995 New approach to the optimization of HNDT applications

Petra Aswendt

Proceedings Volume 2544, Interferometry VII: Techniques and Analysis; (1995) https://doi.org/10.1117/12.211877
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

During the preparation of HNDT applications, it is common practice to carry out a number of experiments in order to gain knowledge about detectable and nondetectable flaws, and to select optimum testing conditions. In many cases, considerable effort is necessary especially for advanced materials with anisotropic properties. This paper proposes an alternate approach: completely simulating the component behavior as well as the HNDT process. Considerable savings occure in both time and cost items, and in addition a direct relationship can be established between the damage significance of a flaw and its visibility by interferometric techniques.

Citation Download Citation

Petra Aswendt "New approach to the optimization of HNDT applications", Proc. SPIE 2544, Interferometry VII: Techniques and Analysis, (14 June 1995); https://doi.org/10.1117/12.211877

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