Three-dimensional whole field deformation measurement by the diffraction principle

Konstatin Galanulis; Reinhold Ritter

doi:10.1117/12.211880

14 June 1995 3D whole field deformation measurement by the diffraction principle

Konstatin Galanulis, Reinhold Ritter

Proceedings Volume 2544, Interferometry VII: Techniques and Analysis; (1995) https://doi.org/10.1117/12.211880
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

A method for measuring deformation using diffraction of light from a grating attached to the surface of flat specimen is presented. By detecting the amplitude and the phase of the diffraction pattern of this grating, its transmission or reflection function can be calculated by the Kirchhoff-Integral. The comparison of these functions in different state of load, leads to the whole-field information of the inplane strain and the out-of-plane dispacement distribution for the illuminated area of the specimen.

Citation Download Citation

Konstatin Galanulis and Reinhold Ritter "3D whole field deformation measurement by the diffraction principle", Proc. SPIE 2544, Interferometry VII: Techniques and Analysis, (14 June 1995); https://doi.org/10.1117/12.211880

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