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29 September 1995 Two-dimensional nonlinear regression for interferogram analysis
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Abstract
A two-dimensional nonlinear regression method for accurate analysis of single-frame interferograms has been developed and tested. Similar to a simple algorithm for one-dimensional regression, analytical expressions of individual terms in a nonlinear intensity model are estimated through an iterative procedure. Computer simulation of experiments and real interferogram analysis show stable convergence and accurate phase extraction of the method. The method also works well under relatively high-level noise and broken fringe interferograms.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Enxi Yu and Soyoung Stephen Cha "Two-dimensional nonlinear regression for interferogram analysis", Proc. SPIE 2546, Optical Techniques in Fluid, Thermal, and Combustion Flow, (29 September 1995); https://doi.org/10.1117/12.221534
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