25 September 1995 Surface science applied to lasers: near-field optical microscopy
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Near-field scattering optical microscopy (NSOM) is used to characterize the emission output and to obtain photoconductivity maps of InGaAsP multiple quantum well lasers. The high spatial resolution of NSOM (approximately (lambda) /20) allows detailed imaging of the laser structure. Emission measurements not only provide direct visualization of the laser mode but also reveal unwanted emission due to InP electroluminescence. Near-field photoconductivity experiments yield high resolution measurement of carrier transport throughout the structure yielding valuable information on current leakage, defect formation, and the quality of p-n junctions.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Steve K. Buratto, Steve K. Buratto, Julia W. P. Hsu, Julia W. P. Hsu, Lisa Dhar, Lisa Dhar, R. B. Byslma, R. B. Byslma, Charles C. Bahr, Charles C. Bahr, Mark J. Cardillo, Mark J. Cardillo, } "Surface science applied to lasers: near-field optical microscopy", Proc. SPIE 2547, Laser Techniques for Surface Science II, (25 September 1995); doi: 10.1117/12.221498; https://doi.org/10.1117/12.221498

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