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26 September 1995 Adaptive microsystems with optical line sensors for measurement and quality control
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Abstract
Today very compact optical sensor systems are realizable with common CMOS processes. Line cameras for visible and near infrared light may include intelligent image processing and a bus interface on the same chip gaining adaptive, robust, and cost efficient microsystems. Major advantages are the contrast of 107 to 1, the variable frequency up to continuous mode and the combination of analog and digital signal processing. Line sensor systems with up to 512 phototransistors for several applications have been realized. The physical and electrical parameters including the on-chip-signal-processing will be explained. For the positioning of rotating parts in machines the position angle may be required with a resolution of 0.5 inches or better. Such angular sensors may be realized as optical line sensors. Specialized color slides have been used as filters in combination with the line sensors.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ingo Martiny and Rolf-Rainer Grigat "Adaptive microsystems with optical line sensors for measurement and quality control", Proc. SPIE 2550, Photodetectors and Power Meters II, (26 September 1995); https://doi.org/10.1117/12.221404
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