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1 September 1995 Linear optical constants of ultrathin copperphthalocyanine films from transmittance and reflectance data: error function minimization when the film thickness is below 20 nm
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Abstract
Thin copperphthalocyanine layers have been deposited on quartz glass substrates and investigated by means of transmission and reflection spectroscopy. The film thickness ranged between 20 nm and the subnanometer region. The determination of the optical constants allowed the estimation of the oscillator strengths for the relevant molecular transitions. A thickness dependence of the Q-band absorption maximum position could be established for layers with a thickness below 5 nm. The contributions of several physical mechanisms to such lineshifts are discussed.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Olaf Stenzel, Ralf Petrich, Steffen Wilbrandt, Ulf Beckers, Alexander Stendal, Kersten Voigtsberger, and Christian von Borczyskowski "Linear optical constants of ultrathin copperphthalocyanine films from transmittance and reflectance data: error function minimization when the film thickness is below 20 nm", Proc. SPIE 2554, Growth and Characterization of Materials for Infrared Detectors II, (1 September 1995); https://doi.org/10.1117/12.218200
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