Infrared (IR) Calibration Measurement Requirements: Development From System Requirements

Gregory R. McNeill; Hayden B. Macurda

doi:10.1117/12.959588

23 December 1980 Infrared (IR) Calibration Measurement Requirements: Development From System Requirements

Gregory R. McNeill, Hayden B. Macurda

Proceedings Volume 0256, Infrared Systems; (1980) https://doi.org/10.1117/12.959588
Event: 1980 Huntsville Technical Symposium, 1980, Huntsville, United States

Abstract

Applicable concepts in sampling statistics are introduced and applied to establish calibration measurement requirements based on sensor performance requirements and sensor measurement characteristics. The sampling statistics included allow the determination of the number of conditions and samples at each condition necessary to meet a specified uncertainty with a given confidence interval. The effect of correlation between parameters in sampling requirement reduction is treated. These analyses are then used to determine data processing loads, data storage requirements and facility operation time required to meet specified levels of system performance.

Citation Download Citation

Gregory R. McNeill and Hayden B. Macurda "Infrared (IR) Calibration Measurement Requirements: Development From System Requirements", Proc. SPIE 0256, Infrared Systems, (23 December 1980); https://doi.org/10.1117/12.959588

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