Lockheed Sensor Test Facility

J. R. Grammer; P. B. Forney

doi:10.1117/12.959595

23 December 1980 Lockheed Sensor Test Facility

J. R. Grammer, P. B. Forney

Proceedings Volume 0256, Infrared Systems; (1980) https://doi.org/10.1117/12.959595
Event: 1980 Huntsville Technical Symposium, 1980, Huntsville, United States

Abstract

The general design features of a new low-background infrared sensor test facility which is being installed at Lockheed Missiles & Space Company, Inc. are described. A brief description of the following is given: the facility layout, clean room facility, vacuum chamber, cryo shroud, cryo/vacuum system, optical system, optical control system, infrared sources, and sensors, overall system control and instrumentation.

Citation Download Citation

J. R. Grammer and P. B. Forney "Lockheed Sensor Test Facility", Proc. SPIE 0256, Infrared Systems, (23 December 1980); https://doi.org/10.1117/12.959595

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