Paper
18 August 1995 Measurement and processing of scattered ultrawideband/short-pulse signals
Edward J. Rothwell, Kun Mu Chen, Dennis P. Nyquist, John Ross, Robert Bebermeyer
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Abstract
High quality ultrawide-band measurements provide a basis for understanding the transient scattering phenomena necessary for the development of short-pulse radar target identification and detection schemes. This paper describes several techniques used at Michigan State University (MSU) for the acquisition, processing, and interpretation of ultra-wideband scattering data. By performing measurements over a sufficiently large bandwidth, the early- time specular nature of a radar target and the late-time resonant behavior can be observed simultaneously within a single target signature. Special attention has been given at MSU to enhancing the equivalent bandwidth of the measurement system through a spectral slicing and extrapolation method. Observation and interpretation of the various scattering phenomena and their dependance on target aspect are then interpreted through several visualization techniques, including scattering plots, frequency-time plots and images.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Edward J. Rothwell, Kun Mu Chen, Dennis P. Nyquist, John Ross, and Robert Bebermeyer "Measurement and processing of scattered ultrawideband/short-pulse signals", Proc. SPIE 2562, Radar/Ladar Processing and Applications, (18 August 1995); https://doi.org/10.1117/12.216950
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Cited by 5 scholarly publications.
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KEYWORDS
Scattering

Calibration

Antennas

Specular reflections

Visualization

Radar

Electromagnetic scattering

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