Paper
3 March 1981 Visible Light Scatter Measurements Of The Advanced X-ray Astronomical Facility (AXAF) Mirror Samples
Donald B Griner
Author Affiliations +
Proceedings Volume 0257, Radiation Scattering in Optical Systems; (1981) https://doi.org/10.1117/12.959619
Event: 1980 Huntsville Technical Symposium, 1980, Huntsville, United States
Abstract
As part of a technological effort for the AXAF program, visible light scatter measurements were made of various mirror samples to determine the surface roughness. The measurements were made to compare with x-ray scatter measurements of the same samples. The data is recorded in a HHDF format described in a doctorate dissertation by James Harvey at the University of Arizona. The total diffuse scatter is calculated using numerical integration techniques and used to estimate the HMS surface roupiness. The technology program is not complete but a summary of the data generated to date is presented.
© (1981) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Donald B Griner "Visible Light Scatter Measurements Of The Advanced X-ray Astronomical Facility (AXAF) Mirror Samples", Proc. SPIE 0257, Radiation Scattering in Optical Systems, (3 March 1981); https://doi.org/10.1117/12.959619
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KEYWORDS
Nickel

Mirrors

Surface roughness

Bidirectional reflectance transmission function

Scanners

Gold

Sensors

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