2 August 1995 Indicatrix measurement based on birefringence retardation using phase modulation technology
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Proceedings Volume 2576, International Conference on Optical Fabrication and Testing; (1995) https://doi.org/10.1117/12.215591
Event: International Conferences on Optical Fabrication and Testing and Applications of Optical Holography, 1995, Tokyo, Japan
Abstract
The measurement of 3D anisotropy, which is the measurement of an indicatrix nx, ny, nz is made by the birefringence measurement with normal and inclined incidence of the light beam. Birefringence retardation contains a fast and a slow axis which are caused by the phase difference of two orthogonal light waves. Information obtained will be different, depending on whether the inclination of a sample is made around the fast axis or the slow axis. Also, depending on the sample to be measured, it is sometimes necessary to incline the sample by changing the azimuthal angle of the sample. Taking into account the recent developments mentioned above, an automatic measuring system of an indicatrix is discussed.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yoshihiro Mochida, "Indicatrix measurement based on birefringence retardation using phase modulation technology", Proc. SPIE 2576, International Conference on Optical Fabrication and Testing, (2 August 1995); doi: 10.1117/12.215591; https://doi.org/10.1117/12.215591
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