2 August 1995 Scattering effects from residual optical fabrication errors
Author Affiliations +
Proceedings Volume 2576, International Conference on Optical Fabrication and Testing; (1995) https://doi.org/10.1117/12.215588
Event: International Conferences on Optical Fabrication and Testing and Applications of Optical Holography, 1995, Tokyo, Japan
Abstract
Scattering effects from residual optical fabrication errors limit the optical performance of many imaging systems. Residual surface roughness over a broad range of relevant spatial frequencies must be specified and controlled for many applications of interest. Wide-angle scatter from surface microroughness severely reduces contrast in extended images. However, small-angle scatter from `mid' spatial frequency surface irregularities that span the gap between the `figure' and `finish' errors will degrade the achievable resolution. Specifying the traditional surface `figure' and `finish' is thus inadequate for high resolution imaging systems or for optical elements fabricated by new automated optical manufacturing processes. A linear systems treatment of surface scatter theory will be presented and its implementation in a computer code for modeling the image degradation effects of residual surface irregularities over the entire range of relevant spatial frequencies will be demonstrated. Parametric performance predictions can then be used to determine realistic optical fabrication tolerances for a variety of applications.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James E. Harvey, Anita Kotha Thompson, "Scattering effects from residual optical fabrication errors", Proc. SPIE 2576, International Conference on Optical Fabrication and Testing, (2 August 1995); doi: 10.1117/12.215588; https://doi.org/10.1117/12.215588
PROCEEDINGS
20 PAGES


SHARE
Back to Top