Paper
2 August 1995 Technique of recording and judging the sign of tilt in one interferogram
Koji Tenjimbayashi
Author Affiliations +
Proceedings Volume 2576, International Conference on Optical Fabrication and Testing; (1995) https://doi.org/10.1117/12.215594
Event: International Conferences on Optical Fabrication and Testing and Applications of Optical Holography, 1995, Tokyo, Japan
Abstract
How to record and judge the sign of tilt, that is the sign of configuration error, in one interferogram where the fringes are frozen is presented. If a flat surface is tested by a Twyman-Green interferometer without an imaging lens, not only usual straight and equally spaced fringes but also the extra curved fringes are caused. We can judge the sign of tilt by knowing which direction the extra fringes are curved. The application of this technique to a lateral shearing interferometer is also shown.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Koji Tenjimbayashi "Technique of recording and judging the sign of tilt in one interferogram", Proc. SPIE 2576, International Conference on Optical Fabrication and Testing, (2 August 1995); https://doi.org/10.1117/12.215594
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Wavefronts

Interferometers

Light sources

Shearing interferometers

Microscopes

Error analysis

Objectives

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