19 January 1996 Holographic microinterferometric technique for measurements of laser diode cavity deformations
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Abstract
Holographic interferometric technique for measurement of laser diode crystal thermoelastic deformations is presented. Using this technique allows us to estimate thermoelastic stresses in laser crystal, active layer temperature and dynamics of heat transfer from laser crystal to heatsink.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ludmila E. Batay, Andrei N. Kuzmin, and Gennadii I. Ryabtsev "Holographic microinterferometric technique for measurements of laser diode cavity deformations", Proc. SPIE 2599, Three-Dimensional and Unconventional Imaging for Industrial Inspection and Metrology, (19 January 1996); doi: 10.1117/12.230383; https://doi.org/10.1117/12.230383
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