Using MTF to evaluate optical systems employing unusual optics

Roy L. Youman

doi:10.1117/12.227919

1 December 1995 Using MTF to evaluate optical systems employing unusual optics

Roy L. Youman

Proceedings Volume 2600, Design, Fabrication, and Applications of Precision Plastic Optics; (1995) https://doi.org/10.1117/12.227919
Event: Photonics East '95, 1995, Philadelphia, PA, United States

Abstract

With the proliferation of aspheric and unusual optical surfaces in many optical systems, manufacturers are finding that conventional optical metrology methods are no longer suitable when characterizing these systems. For example, monochromatic interferometric measurements of individual components are being replaced by methods which determine system performance by analyzing the actual image produced by the optical system. This presentation will cover MTF and how it is used to characterize optical assemblies and systems employing unusual optical components.

Citation Download Citation

Roy L. Youman "Using MTF to evaluate optical systems employing unusual optics", Proc. SPIE 2600, Design, Fabrication, and Applications of Precision Plastic Optics, (1 December 1995); https://doi.org/10.1117/12.227919

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