28 August 1995 Automatic planning for probe measurement
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Proceedings Volume 2620, International Conference on Intelligent Manufacturing; (1995) https://doi.org/10.1117/12.217485
Event: International Conference on Intelligent Manufacturing, 1995, Wuhan, China
Abstract
Probe measurement is one way to get some information about workpiece and machining status on-line. In this paper, the principle and feature of the probe system used in on-line measurement is discussed, and the algorithm for automatic measurement planning according to the information from the CAD system is presented.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tongjun Huang, Guanhong Duan, Ji Zhou, William Thompson, "Automatic planning for probe measurement", Proc. SPIE 2620, International Conference on Intelligent Manufacturing, (28 August 1995); doi: 10.1117/12.217485; https://doi.org/10.1117/12.217485
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