28 August 1995 Automatic planning for probe measurement
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Proceedings Volume 2620, International Conference on Intelligent Manufacturing; (1995) https://doi.org/10.1117/12.217485
Event: International Conference on Intelligent Manufacturing, 1995, Wuhan, China
Abstract
Probe measurement is one way to get some information about workpiece and machining status on-line. In this paper, the principle and feature of the probe system used in on-line measurement is discussed, and the algorithm for automatic measurement planning according to the information from the CAD system is presented.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tongjun Huang, Tongjun Huang, Guanhong Duan, Guanhong Duan, Ji Zhou, Ji Zhou, William Thompson, William Thompson, } "Automatic planning for probe measurement", Proc. SPIE 2620, International Conference on Intelligent Manufacturing, (28 August 1995); doi: 10.1117/12.217485; https://doi.org/10.1117/12.217485
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