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28 August 1995 Object-oriented visual language for IC test
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Proceedings Volume 2620, International Conference on Intelligent Manufacturing; (1995) https://doi.org/10.1117/12.217455
Event: International Conference on Intelligent Manufacturing, 1995, Wuhan, China
Abstract
This paper presents a visual language for integrated circuit (IC) test. It abstracts the test flow as several classes which map to some forms. Test engineers can use the form-based environment which reduces the cost of developing high quality programs. Test classes are defined by AT&T C++ 2.0. Forms are implemented by X-Window. All the systems run on a SUN SPARC workstation.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
XiaoMing Wang and QiaoLin Yang "Object-oriented visual language for IC test", Proc. SPIE 2620, International Conference on Intelligent Manufacturing, (28 August 1995); https://doi.org/10.1117/12.217455
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