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28 August 1995 Parallelism of fault diagnosis for large-scale mechatronic systems
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Proceedings Volume 2620, International Conference on Intelligent Manufacturing; (1995) https://doi.org/10.1117/12.217515
Event: International Conference on Intelligent Manufacturing, 1995, Wuhan, China
Abstract
Real-time fault diagnosis for large-scale mechatronic systems is a fairly complex problem and has not been solved up to now. Parallel processing and distributed artificial intelligence (DAI), as rapidly emerging and promising technologies, provide powerful tools for solving this hard problem. Based on the study of basic fault diagnosis process for large-scale mechatronic systems, the idea of parallel processing and DAI is introduced into the fault diagnosing field. The parallelism at four different levels in the fault diagnosis process is proposed. It lays down the theoretical basis for the development of the real-time parallel distributed fault diagnosing system.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Junqi Li, Tielin Shi, Xue-Chuan Wang, and Shuzi Yang "Parallelism of fault diagnosis for large-scale mechatronic systems", Proc. SPIE 2620, International Conference on Intelligent Manufacturing, (28 August 1995); https://doi.org/10.1117/12.217515
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