18 August 1995 Improved Bayesian approach
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Proceedings Volume 2622, Optical Engineering Midwest '95; (1995) https://doi.org/10.1117/12.216885
Event: Optical Engineering Midwest '95, 1995, Chicago, IL, United States
Abstract
The Bayesian approach that employs the concepts of cliques and line sites in its Gibbs prior provides the potential of realistic and objective characterization of boundaries between different regions exhibiting intensity variations in the reconstructed images. In this work, we develop an improved Bayesian approach for accurate detection of boundaries by introducing symmetric cliques and new types of line sites as well as a new calculation scheme. This improved Bayesian approach has been applied to positron emission tomography data from both computer simulations and patient studies. The results demonstrate that the new cliques, line sites, and calculation scheme can enhance the boundary detectability of the Bayesian approach and yield realistic boundaries and hence improved reconstructed images.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiaochuan Pan, Chin-Tu Chen, Chien-Min Kao, Wing H. Wong, "Improved Bayesian approach", Proc. SPIE 2622, Optical Engineering Midwest '95, (18 August 1995); doi: 10.1117/12.216885; https://doi.org/10.1117/12.216885
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