Translator Disclaimer
27 December 1995 Oblique-incidence reflectometry: one relative profile measurement of diffuse reflectance yields two optical parameters
Author Affiliations +
Abstract
A new, simple and quick approach, oblique-incidence reflectometry, was used to measure the absorption and reduced scattering coefficients of a semi-infinite turbid medium. An obliquely incident light beam causes the center of the far diffuse reflectance to shift from the point of incidence, where the far diffuse reflectance refers to the diffuse reflectance that is several transport mean free paths away from the incident point. The amount of shift yields the diffusion constant by a simple formula, and the slope of the diffuse reflectance yields the attenuation coefficient. Only the relative profile of the diffuse reflectance is needed to deduce both optical parameters, which makes this method attractive in clinical settings because it does not require a stringent calibration for absolute quantity measurements. This method was tested theoretically by Monte Carlo simulations and experimentally by a reflectometer. Because this method can be used to measure optical properties of biological tissues quickly and requires only inexpensive equipment, it has potential clinical application to the diagnosis of disease or monitoring of treatments.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lihong V. Wang, Shao-Pow Lin, Steven L. Jacques, Frank K. Tittel, Jennifer Harder, John Jancarik, Beth Michelle Mammini, Ward Small IV, and Luiz Barroca Da Silva "Oblique-incidence reflectometry: one relative profile measurement of diffuse reflectance yields two optical parameters", Proc. SPIE 2627, Optical Biopsies, (27 December 1995); https://doi.org/10.1117/12.228887
PROCEEDINGS
11 PAGES


SHARE
Advertisement
Advertisement
Back to Top