4 October 1995 Influence of an eccentric transducer on V(z) measurement
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Proceedings Volume 2643, Acousto-Optics and Applications II; (1995); doi: 10.1117/12.222764
Event: Acousto-Optics and Applications VI, 1995, Gdansk-Jurata, Poland
Abstract
Usually the acoustic field at the back side of a sapphire lens in a scanning acoustic microscope is calculated considering a transducer that is not shifted relative to the optical axis. In a simple model these calculations were modified by taking a parallel shift of the circular transducer into account. With this modified acoustic field at the back side of the lens the V(z) curve for an ideal reflector and for a material which properties are similar to those of aluminium is calculated. These simulations are used for a qualitative analysis of the influence of a transducer shift on V(z) measurement.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ulla Scheer, Klaus Kosbi, Siegfried Boseck, "Influence of an eccentric transducer on V(z) measurement", Proc. SPIE 2643, Acousto-Optics and Applications II, (4 October 1995); doi: 10.1117/12.222764; http://dx.doi.org/10.1117/12.222764
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KEYWORDS
Transducers

Acoustics

Sapphire

Spherical lenses

Aluminum

Reflectors

Reflectivity

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