10 November 1995 Fractal scattering structure analysis using scanning interferometer with focused probing beams
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Proceedings Volume 2647, International Conference on Holography and Correlation Optics; (1995) https://doi.org/10.1117/12.226677
Event: International Conference on Holography and Correlation Optics, 1995, Chernivsti, Ukraine
Abstract
A method of evaluation of the phase fluctuations structure function parameters for large-scale transparent scattering objects using scanning differential microinterferometer is presented. Experimental results obtained for rough glass plate with specially prepared surfaces show the existence of fractal properties in the region of characteristic sizes from 0.5 micrometer to 15 micrometer. These properties are manifested in the values of the exponential factor of phase structure function which are less than 2 (such value is characteristic for conventional 'smooth' surfaces). Potentialities of usage of the scanning interferometric technique for the analysis of scaling properties of the phase distributions formed by the scattering objects under coherent illumination are discussed.
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Dmitry A. Zimnyakov, Valery V. Tuchin, Kirill V. Larin, Alexey A. Mishin, Igor S. Peretochkin, "Fractal scattering structure analysis using scanning interferometer with focused probing beams", Proc. SPIE 2647, International Conference on Holography and Correlation Optics, (10 November 1995); doi: 10.1117/12.226677; https://doi.org/10.1117/12.226677
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