3 November 1995 Application of surface plasmon resonance for the investigation of ultrathin metal films
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Proceedings Volume 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1995) https://doi.org/10.1117/12.226156
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1995, Kiev, Ukraine
Abstract
We analyze potentialities of the surface plasmon resonance (SPR) when investigating thin transition layers at the outer, as well as inner, boundaries of the high conductance metal film on a glass substrate. Using the objective function, one can determine, with high accuracy, more than three optical parameters of the SPR supporting two-layer metal film. The data obtained by our method for the Mn:Ag two-layer system are compared with those given by the traditional quartz microbalance method. A good agreement is found between the two sets of thickness and refractive index values for both layers.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sergey A. Kostyukevych, Sergey A. Kostyukevych, Yuri M. Shirshov, Yuri M. Shirshov, E. P. Matsas, E. P. Matsas, Alexander V. Stronski, Alexander V. Stronski, Yuri V. Subbota, Yuri V. Subbota, Vladimir I. Chegel, Vladimir I. Chegel, Peter E. Shepeljavi, Peter E. Shepeljavi, } "Application of surface plasmon resonance for the investigation of ultrathin metal films", Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); doi: 10.1117/12.226156; https://doi.org/10.1117/12.226156
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