3 November 1995 Determination of profile parameters of planar waveguides
Author Affiliations +
Proceedings Volume 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1995); doi: 10.1117/12.226169
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1995, Kiev, Ukraine
Abstract
The simple nondestructive method for reconstruction of the refractive index distribution in the waveguide cross section is presented. Sample surface immersing and the interferometric method of registration are utilized in this technique.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dmitry V. Svistunov, "Determination of profile parameters of planar waveguides", Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); doi: 10.1117/12.226169; https://doi.org/10.1117/12.226169
PROCEEDINGS
6 PAGES


SHARE
KEYWORDS
Planar waveguides

Interferometers

Interferometry

Liquids

Waveguides

Dispersion

Nondestructive evaluation

Back to Top